Standard

IEC 60749-6:2002 ED1

Apr 2002 Revised

Note: This standard has a new edition: IEC 60749-6:2017 ED2

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Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 6: Storage at high temperature Revised IEC 60749-6:2002/COR1:2003 ED1 Corrigendum from Publication date: Aug 2003 Version: 1 Language: English/French Services: Read Online (No printing ), Printed and bound

Abstract

Aims at testing and determining the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive. The contents of the corrigendum of August 2003 have been included in this copy.

Document information

Standard from IEC
Published: 12 April 2002
Withdrawn: 3 March 2017
Edition: 1
Version: 1
Document type: IS
Pages
ISBN: 2831862884

ICS 31.080.01
ISO TC TC 47

Product Relations

Revised by: IEC 60749-6:2017 ED2
Adopted by: NEK ISO/IEC TR 24725-1:2011
Replaces: IEC PAS 62205:2000 ED1
Partially replaces: IEC 60749:1996 ED2

IEC 60749-6:2002 ED1

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IEC 60749-6:2017 ED2