Standard

IEC 60749-27:2006 ED2

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Note: This standard has a new edition: IEC 60749-27:2006+AMD1:2012 CSV

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Abstract

Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined machine model (MM) electrostatic discharge (ESD). It may be used as an alternative test method to the human body model ESD test method. The objective is to provide reliable, repeatable ESD test results so that accurate classifications can be performed. This test method is applicable to all semiconductor devices and is classified as destructive

Document information

  • Standard from IEC
  • Published:
  • Edition: 2
  • Version: 1
  • Document type: IS
  • ICS 31.080.01
  • ISO TC TC 47

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