Standard

IEC 60749-26:2003 ED1

Revised

Note: This standard has a new edition: IEC 60749-26:2025 ED5

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Abstract

Establishes a standard procedure for testing and classifying semiconductor devices according to their susceptibility to damage or degradation by exposure to a defined human body model electrostatic discharge. The objective is to provide reliable, repeatable test results so that accurate classifications can be performed. The testing shall be selected from this test method or the machine model test method (see IEC 60749-27).

Document information

  • Standard from IEC
  • Published:
  • Withdrawn:
  • Edition: 1
  • Version: 1
  • Document type: IS
  • ICS 31.080.01
  • ISO TC TC 47

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