Standard

IEC 60748-11:1990 ED1

Dec 1990 Published

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Abstract

Applies to encapsulated semiconductor integrated circuits, including multichip integrated circuits, but excluding hybrid circuits. Gives details of the Quality Assessment Procedures, the inspection requirements, screening sequences, sampling requirements, test and measurement procedures required for the assessment of semiconductor integrated circuits, including digital, analogue and interface circuits.

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Standard from IEC
Published: 20 December 1990
Edition: 1
Version: 1
Document type: IS
ISBN: 2831819237

ICS 31.200
ISO TC TC 47/SC 47A

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Adopted by: NEK IEC 61443:1999+A1:2008 CSV

IEC 60748-11:1990 ED1

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Extended editions Extended editions (0)

Version history Related corrigendum and amendments (2)

IEC 60748-11:1990/AMD2:1999 ED1

IEC 60748-11:1990/AMD1:1995 ED1

Abstract

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