Standard

IEC 60747-5:1992 ED2

Apr 1992 Replaced

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Language English/French

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Amendment 2 - Semiconductor devices - Discrete devices and integrated circuits - Part 5: Optoelectronic devices Replaced IEC 60747-5:1992/AMD2:1995 ED2 Amendment from Publication date: Apr 1995 Version: 1 Pages: 17 Language: English/French Services: Read Online (No printing ), Printed and bound
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Amendment 1 - Semiconductor devices - Discrete devices and integrated circuits - Part 5: Optoelectronic devices Replaced IEC 60747-5:1992/AMD1:1994 ED2 Amendment from Publication date: Nov 1994 Version: 1 Pages: 101 Language: English/French Services: Read Online (No printing ), Printed and bound

Abstract

Provides terminology, letter symbols, essential ratings and characteristics as well as measuring methods for semiconductor photo-emitters, photo-electric detectors, photo-sensitive devices and semiconductor devices utilizing optical radiation for internal operation.

Document information

Standard from IEC
Published: 15 April 1992
Withdrawn: 30 June 2004
Edition: 2
Version: 1
Document type: IS
Pages
ISBN: 2831822726

ICS 31.260
ISO TC TC 110

Product Relations

Adopted by: NEK IEC TR 61340-1:2012
Replaced by: IEC 60747-5-3:1997+AMD1:2002 CSV
Replaced by: IEC 60747-5-2:1997+AMD1:2002 CSV
Replaced by: IEC 61747-6:2004 ED1
Replaced by: IEC 61747-4:1998 ED1
Replaced by: IEC 61747-5:1998 ED1
Replaced by: IEC 60747-5-2:1997 ED1
Replaced by: IEC 60747-5-3:1997 ED1
Revises: IEC 60747-5:1984 ED1
Replaces: IEC 60147-1K:1981 ED2

IEC 60747-5:1992 ED2

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