Standard

IEC 60747-14-3:2009 ED2

Apr 2009 Published

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Abstract

IEC 60747-14-3:2009 specifies requirements for semiconductor pressure sensors measuring absolute, gauge or differential pressures. The major technical change with regard to the previous edition is the addition of a new subclause 5.9 (measuring method of linearity). This publication should be read in conjunction with IEC 60747-1:2006.

Document information

Standard from IEC
Published: 29 April 2009
Edition: 2
Version: 1
Document type: IS
ISBN:

ICS 31.080.99
ISO TC TC 47/SC 47E

Product Relations

Revises: IEC 60747-14-3:2001 ED1

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Revised

IEC 60747-14-3:2001 ED1
Current product

Published

IEC 60747-14-3:2009 ED2
Stage 60.60

IEC 60747-14-3:2009 ED2

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