Standard

IEC 60747-11:1985 ED1

Jan 1985 Withdrawn

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Abstract

Applies to discrete semiconductor devices, excluding optoelectronic devices. Should be read together with the generic specification to which it refers: it gives details of the Quality Assessment Procedures, the inspection requirements, screening sequences, sampling requirements, test and measurement procedures required for the assessment of semiconductor devices.

Document information

Standard from IEC
Published: 1 January 1985
Withdrawn: 31 July 2015
Edition: 1
Version: 1
Document type: IS
ISBN: 2831811058

ICS 31.080.01
ISO TC TC 47/SC 47E

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Adopted by: NEK IEC 61375-2-1:2012

IEC 60747-11:1985 ED1

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Version history Related corrigendum and amendments (2)

IEC 60747-11:1985/AMD2:1996 ED1

IEC 60747-11:1985/AMD1:1991 ED1

Abstract

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