Standard

IEC 60747-1:2006 ED2

Feb 2006 Published

Note: This standard has a new edition: IEC 60747-1:2006+AMD1:2010 CSV

Preview External link

Corrigendums and amendments are bought separately.

Language English English/French

Services Read Online (No printing ) kr 3 990,00 Printed and bound Delivery time: 5-10 days kr 4 987,00

There are no extended editions available for this standard

Open product
Amendment 1 - Semiconductor devices - Part 1: General Published IEC 60747-1:2006/AMD1:2010 ED2 Amendment from Publication date: May 2010 Version: 1 Language: English, English/French Services: Read Online (No printing ), Printed and bound
Open product
Corrigendum 1 - Semiconductor devices - Part 1: General Published IEC 60747-1:2006/COR1:2008 ED2 Corrigendum from Publication date: Sep 2008 Version: 1 Language: English Services: Read Online (No printing ), Printed and bound

Abstract

IEC 60747-1:2006 gives the general requirements applicable to the discrete semiconductor devices and integrated circuits covered by the other parts of IEC 60747 and IEC 60748 (see Annex A). This second edition of IEC 60747-1 cancels and replaces the first edition (1983) and its amendments 1 (1991), 2 (1993) and 3 (1996). The main changes with respect to the previous edition are listed below: a) The terminology which is now given in the IEV (or which was in conflict with the IEV) has been omitted. b) There has been a general revision of guidance on essential ratings and characteristics. c) The distinction between general and reference methods of measurement has been removed. d) A clause on product discontinuation notice has been added.

Document information

Standard from IEC
Published: 21 February 2006
Edition: 2
Version: 1
Document type: IS
Pages
ISBN: 2831884063

ICS 31.080.01
ISO TC TC 47

Product Relations

Revises: IEC 60747-1:1983 ED1

IEC 60747-1:2006 ED2

Access to standards for the entire organization

Benefits of our business solution:

Contact us today for a non-binding offer

IEC 60747-1:2006+AMD1:2010 CSV