Standard

IEC 60404-2:1978 ED2

Jan 1978 Revised

Note: This standard has a new edition: IEC 60404-2:1996+AMD1:2008 CSV

Corrigendums and amendments are bought separately.

Language English/French

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Abstract

Describes the standard 25 cm Epstein frame and associated circuitry, to be used for determining the B-H characteristic (both for d.c. and for sinusoidal secondary voltage), specific total losses, permeability, and reciprocal of complex permeability. Describes also the standard methods for determining resistivity, coefficient of surface insulation resistance, stacking factor, and density.

Document information

Standard from IEC
Published: 1 January 1978
Withdrawn: 28 March 1996
Edition: 2
Version: 1
Document type: IS
ISBN: 2831805325

ISO TC TC 68

Product Relations

Revised by: IEC 60404-2:1996+AMD1:2008 CSV
Adopted by: NEK IEC 60774-5:2004
Revised by: IEC 60404-2:1996 ED3

Product life cycle

Current product

Revised

IEC 60404-2:1978 ED2
Stage 99.60
Revised by

Published

IEC 60404-2:1996+AMD1:2008 CSV

Published

IEC 60404-2:1996 ED3

IEC 60404-2:1978 ED2

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IEC 60404-2:1996+AMD1:2008 CSV

IEC 60404-2:1996 ED3