Standard

IEC 60333:1993 ED3

Jul 1993 Withdrawn

Note: This standard has a new edition: IEC 60333:1983 ED2

Corrigendums and amendments are bought separately.

Language English/French

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Abstract

Applies to semiconductor radiation detectors which are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described have been selected to be readily available to all manufacturers and users of semiconductor charged-particle detectors.

Document information

Standard from IEC
Published: 14 July 1993
Withdrawn: 15 July 2010
Edition: 3
Version: 1
Document type: IS
ISBN: 2831827566

ICS 17.240
ISO TC TC 45

Product Relations

Adopted by: NEK IEC 60601-1-8:2006
Revises: IEC 60333:1983 ED2

Product life cycle

Previous product

Revised

IEC 60333:1983 ED2
Current product

Withdrawn

IEC 60333:1993 ED3
Stage 95.99

IEC 60333:1993 ED3

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