Standard

IEC 60068-2-82:2007 ED1

May 2007 Revised

Note: This standard has a new edition: IEC 60068-2-82:2019 ED2

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Corrigendum 1 - Environmental testing - Part 2-82: Tests - Test XW1: Whisker test methods for electronic and electric components Revised IEC 60068-2-82:2007/COR1:2009 ED1 Corrigendum from Publication date: Dec 2009 Version: 1 Language: English/French Services: Read Online (No printing ), Printed and bound

Abstract

IEC 60068-2-82:2007 specifies whisker tests for electric or electronic components representing the finished stage, with tin or tin-alloy finish. However, the standard does not specify tests for whiskers that may grow as a result of external mechanical stress. This test method is employed by a relevant specification (international component or application specification) with transfer of the test severities to be applied and with defined acceptance criteria. Where tests described in this standard are considered for other components, e.g. mechanical parts as used in electrical or electronic equipment, it should be ensured that the material system and whisker growth mechanisms are comparable. The contents of the corrigendum of December 2009 have been included in this copy.

Document information

Standard from IEC
Published: 23 May 2007
Withdrawn: 14 May 2019
Edition: 1
Version: 1
Document type: IS
Pages
ISBN: 2831891620

ICS 19.040
ISO TC TC 91

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Revised by: IEC 60068-2-82:2019 ED2

IEC 60068-2-82:2007 ED1

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IEC 60068-2-82:2019 ED2