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NEK IEC TS 62607-6-11:2022

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IEC TS 62607-6-11:2022(EN) establishes a standardized method to determine the key control characteristic• defect density nDof graphene films grown by chemical vapour deposition as well as exfoliated graphene flakes by• Raman spectroscopy

Dokumentinformasjon

  • Standard fra NEK
  • Publisert:
  • Utgave: 1.0
  • Versjon: 1
  • Varetype: TS
  • Products.Specs.pages
  • ICS 07.120
  • National Committee NEK/NK113