Standard

JEDEC JESD91B

Publisert
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Omfang

The method described in this document applies to all reliability mechanisms associated with electronic devices. The purpose of this standard is to provide a reference for developing acceleration models for defect-related and wear-out mechanisms in electronic devices.

Dokumentinformasjon

  • Standard fra JEDEC_AC
  • Publisert:
  • Versjon: 0
  • Varetype: IS