Standard

JEDEC EIA-323

Publisert
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Omfang

This standard is applicable to life testing of lead-mounted semiconductor devices intended for applications in a natural air-cooled environment where most of the power dissipation is obtained by convection and radiation losses from the body to the device.

Dokumentinformasjon

  • Standard fra JEDEC_AC
  • Publisert:
  • Versjon: 0
  • Varetype: IS