Standard

IEC 60749-36:2003 ED1

Publisert

Rettelser og tillegg kjøpes separat.

Språk
Tjenester

Omfang

Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.

Dokumentinformasjon

  • Standard fra IEC
  • Publisert:
  • Utgave: 1
  • Versjon: 1
  • Varetype: IS
  • Products.Specs.pages
  • ICS 31.080.01
  • ISO TC TC 47

Produktrelasjon