Standard

SAE AS6294/3

Published

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Abstract

This document establishes the requirements for screening, qualification, and lot acceptance testing of Plastic Encapsulated Discrete Semiconductors (PEDS) for use in space application environments. The scope of this document is intended for standard silicon based technology only, but the process and methodology described within can be adopted for other technologies such as Silicon Carbide, Gallium Nitride, and Gallium Arsenide. However, when non-silicon based technology parts are being used, the device characterization shall be modified, and it is recommended to use available industry standards based upon published research/testing reports for those technology to address applicable physics of failure. PURPOSE Plastic encapsulated products have been used based on testing and analysis for high reliability applications such as those for medical, military hardware, and space applications. There are some complex Electrical, Electronic, and Electromechanical (EEE) products that may only exist in plastic packages and have been risk mitigated for the intended applications. However, the industry needs different ways of screening and qualifying PEDS. This document was created by a subcommittee of SAE CE-12 to standardize a PEDS flow and address possible future extension of the QML system to include PEDS for space. The committee has utilized existing AS6294/1 as baseline and cross references NASA Goddard PEM-INST-001, NASA EEE-INST-002, NASA Marshall Space Flight Center MSFC-STD-3012, and SAE SSB-1, as well as reviews of multiple industry practices.

Document information

  • Standard from SAE_AC
  • Published:
  • Version: 0
  • Document type: IS