Standard

SAE AS6171/2A

Published

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Abstract

This document describes the requirements of the following test methods for counterfeit detection of electronic components Method A: General EVI, Sample Selection, and Handling Method B: Detailed EVI, including Part Weight measurement Method C: Testing for Remarking Method D: Testing for Resurfacing Method E: Part Dimensions measurement Method F: Surface Texture Analysis using SEM The scope of this document is focused on leaded electronic components, microcircuits, multi-chip modules (MCMs), and hybrids. Other EEE components may require evaluations not specified in this procedure. Where applicable this document can be used as a guide. Additional inspections or criteria would need to be developed and documented to thoroughly evaluate these additional part types. If AS6171/2 is invoked in the contract, the base document, AS6171 General Requirements shall also apply Purpose This standard establishes requirements for the inspection process, documentation of results, personnel qualification, and the inspection equipment to be used. It also outlines techniques to detect suspect counterfeit parts by a trained inspector

Document information

  • Standard from SAE_AC
  • Published:
  • Version: 0
  • Document type: IS