Standard

NEK IEC TS 63371-1:2026

Mar 2026 Published

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Abstract

IEC TS 63371-1:2026 applies to crystalline silicon wafers for use as the substrates in making photovoltaic cells. It describes the methods for measuring the electrical characteristics of these silicon wafers. It does not provide mechanical information about these wafers. Annex A shows the widely accepted electrical characteristics values. The purpose of this document is to establish a standardized specification for crystalline silicon wafers, defining their electrical characteristics, the applicable test methods, and the acceptable value ranges for those characteristics.

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Standard from NEK
Published: 15 March 2026
Edition: 1.0
Version: 1
Document type: TS
ISBN:

ICS 27.160

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Adopted from: IEC TS 63371-1:2026

NEK IEC TS 63371-1:2026

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Abstract

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Abstract

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