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NEK IEC TS 62876-4-1:2025

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Abstract

IEC TS 62876-4-1:2025, which is a Technical Specification, establishes a general reliability testing programme to verify the reliability of the performance of quantum dots nanomaterials, and quantum dot enabled light conversion films (Q-LCFs).The Q-LCF is used as subassemblies for the fabrication of nano-enabled photoelectrical display devices, mainly liquid crystal display (LCD) currently, with other components.This testing programme defines standardized aging conditions, methodologies and data assessment for Q-LCF product.The results of these tests define a stability under standardized aging conditions for quantitative evaluation of the reliability of the Q-LCF.The procedures specified in this document were designed for Q-LCF but can be extended to serve as a guideline for other kinds of light conversion films or related subassemblies as well.

Document information

  • Standard from NEK
  • Published:
  • Edition: 1.0
  • Version: 1
  • Document type: TS
  • ICS 07.120
  • National Committee NEK/NK113

Product Relations

  • Adopted from: IEC TS 62876-4-1:2025