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Standard

NEK IEC TS 62607-6-14:2020

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Abstract

IEC TS 62607-6-14:2020 establishes a standardized method to determine the structural key control characteristic• defect levelfor powders consisting of graphene-based material by• Raman spectroscopy.The defect level is derived by the intensity ratio of the D+D′ band and 2D band in Raman spectrum, ID+D′/I2D.• The defect level determined in accordance with this document will be listed as a key control characteristic in the blank detail specification for graphene IEC 62565-3-1 for graphene powder.• The method is applicable for graphene powder or graphene-based material, e.g. reduced graphene oxide (rGO), bilayer graphene, trilayer graphene and few-layer graphene.• Typical application areas are quality control and classification for graphene manufacturers, and product selection for downstream users.• The method described in this document is appropriate if the physical form of graphene is powder.

Document information

  • Standard from NEK
  • Published:
  • Edition: 1.0
  • Version: 1
  • Document type: TS
  • ICS 07.120
  • National Committee NEK/NK113

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  • Adopted from: IEC TS 62607-6-14:2020