Standard

NEK IEC TS 61945:2000

Mar 2000 Published

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Language English

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Abstract

Gives the methodology for technology and failure analysis in manufacturing integrated circuits. Technology analysis is used to determine the way a component is built by observing it using adequate resolution, which increases progressively with the level of analysis.

Document information

Standard from NEK
Published: 10 March 2000
Edition: 1.0
Version: 1
Document type: TS
ISBN:

ICS 31.200
National Committee NEK/NK47

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Adopted from: IEC 60893-3-6:1993 ED1

NEK IEC TS 61945:2000

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Abstract

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Abstract

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