Standard

NEK IEC TR 63133:2017

Published

Corrigenda and amendments are bought separately.

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Abstract

IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.

Document information

  • Standard from NEK
  • Published:
  • Edition: 1.0
  • Version: 1
  • Document type: TR
  • ICS 31.080.01
  • National Committee TC 47

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