Standard

NEK IEC TR 61189-5-506:2019

Jun 2019 Published

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Abstract

IEC TR 61189-5-506:2019(E) is an intercomparison supporting the development of IEC 61189-5-501 in relation to the SIR method. This document sets out to validate the introduction of a new 200-µm gap SIR pattern, and was benched marked against existing SIR gap patterns of 318 µm and 500 µm.

Document information

Standard from NEK
Published: 26 June 2019
Edition: 1.0
Version: 1
Document type: TR
Pages
ISBN:

ICS 31.180
National Committee NEK/NK91

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Adopted from: IEC 60335-2-3:2022 CMV
Adopted from: IEC 60335-2-3:2022 EXV
Adopted from: IEC 60335-2-3:2022 ED7

NEK IEC TR 61189-5-506:2019

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Abstract

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Abstract

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