Standard

NEK IEC PAS 62206:2000

Nov 2000 Withdrawn

Corrigendums and amendments are bought separately.

Language English

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Abstract

Aims at determining the ability of a device to withstand alternate exposures at high and low temperature extremes with operating biases periodically applied and removed. It is intended to simulate worst case conditions encountered in typical applications and considered destructive.

Document information

Standard from NEK
Published: 28 November 2000
Withdrawn: 10 March 2004
Edition: 1.0
Version: 1
Document type: PAS
ISBN:

ICS 31.080.01
National Committee NEK/NK47

Product Relations

Replaced by: NEK IEC 60749-34:2004
Adopted from: IEC PAS 62206:2000

NEK IEC PAS 62206:2000

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Abstract

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Abstract

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