Standard

NEK IEC PAS 62205:2000

Withdrawn

Corrigendums and amendments are bought separately.

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Abstract

Aims at determining the effect on solid state electronic devices of storage at elevated temperature without electrical stress applied. This test is considered destructive.

Document information

  • Standard from NEK
  • Published:
  • Withdrawn:
  • Edition: 1.0
  • Version: 1
  • Document type: PAS
  • Pages
  • ICS 31.080.01
  • National Committee TC 47

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