Standard

NEK IEC PAS 62162:2000

Aug 2000 Withdrawn

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Language English

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Abstract

Describes a uniform method for establishing charged-device model (CDM) electrostatic discharge (ESD) withstand thresholds. All packages semiconductor components, thin film circuits, surface acoustic wave (SAW) components, opto-electronic components, hybrid integrated circuits (HICS), and multi-chip modules (MCMs) containing any of these components are to be evaluated according to this standard. IEC/PAS 62162 will be re-issued in the form of IEC international standard under reference IEC 60748-20.

Document information

Standard from NEK
Published: 22 August 2000
Withdrawn: 7 June 2019
Edition: 1.0
Version: 1
Document type: PAS
ISBN:

ICS 31.080.01
National Committee NEK/NK47

Product Relations

Replaced by: NEK IEC 60749-28:2017
Adopted from: IEC PAS 62162:2000

NEK IEC PAS 62162:2000

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Abstract

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Abstract

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