Standard

NEK IEC PAS 61338-1-5:2010

May 2010 Withdrawn

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Language English

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Abstract

IEC/PAS 61338-1-5:2010(E) describes a measurement method for resistance and effective conductivity at the interface between conductor layer and dielectric substrate.

Document information

Standard from NEK
Published: 19 May 2010
Withdrawn: 25 June 2015
Edition: 1.0
Version: 1
Document type: PAS
ISBN:

ICS 31.140
National Committee NEK/NK49

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Replaced by: NEK IEC 61338-1-5:2015
Adopted from: IEC PAS 61338-1-5:2010

NEK IEC PAS 61338-1-5:2010

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Abstract

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Abstract

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