Standard

NEK IEC 62951-3:2018

Nov 2018 Published

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Language English

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Abstract

IEC 62951-3:2018(E) specifies the method for evaluating thin film transistor characteristics on flexible substrates under bulging. The thin film transistor is fabricated on flexible substrates, including polyethylene terephthalate (PET), polyimide (PI), elastomer and others. The stress is applied by applying a uniformly-distributed pressure to the flexible substrate using the equipment.

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Standard from NEK
Published: 7 November 2018
Edition: 1.0
Version: 1
Document type: NAT
ISBN:

ICS 31.080.99
National Committee NEK/NK47

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Adopted from: IEC 62951-3:2018

NEK IEC 62951-3:2018

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Abstract

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Abstract

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