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Standard

NEK IEC 62899-203-2:2025

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Abstract

IEC 62899-203-2:2025 specifies a method to measure the values of effective charge carrier mobility in printed semiconductive layers using space charge limited current (SCLC) mobility technique. The method described is intended to be used as a benchmark test to allow reproducible measurements at a given temperature of the apparent charge carrier mobility for comparison with devices that use different materials, material formulations and fabrication processes for a planar configuration. This document specifies the sample and equipment requirements, and describes the measurement technique, the data analysis procedure and the reporting protocol.This document is suitable to test unipolar devices (i.e. hole-only or electron-only), where charge injection is efficient and where series resistance does not dominate the current-voltage curve. Therefore, it cannot be used for testing high-electron mobility devices where electron injection can be problematic, for testing highly doped materials where space charge limited current does not exist, or to evaluate mobility in applications that require lateral charge transport, such as in transistors.

Document information

  • Standard from NEK
  • Published:
  • Edition: 1.0
  • Version: 1
  • Document type: NAT
  • ICS 31.180
  • ICS 87.080

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  • Adopted from: IEC 62899-203-2:2025