Standard

NEK IEC 62878-1-1:2015

May 2015 Published

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Language English

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Abstract

IEC 62878-1-1:2015 specifies the test methods of passive and active device embedded substrates. The basic test methods of printed wiring substrate materials and substrates themselves are specified in IEC 61189-3. This part of IEC 62878 is applicable to device embedded substrates fabricated by use of organic base material, which include for example active or passive devices, discrete components formed in the fabrication process of electronic wiring board, and sheet formed components.

Document information

Standard from NEK
Published: 20 May 2015
Edition: 1.0
Version: 1
Document type: NAT
ISBN:

ICS 31.180
ICS 31.190
National Committee NEK/NK91

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Adopted from: IEC 62878-1-1:2015

NEK IEC 62878-1-1:2015

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Abstract

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Abstract

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