Standard

NEK IEC 62527:2007

Nov 2007 Published

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Language English

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Abstract

STIL language constructs are defined to specify the DC conditions necessary to excute digital vectors on automated test equipment(ATE). STIL language extensions include structures for:(a) specifying the DC conditions for a device under test; specifying DC conditions either globally, by pattern burst, by pattern, or by vector;(c) specifying alternate DC levels;and (d) selecting DC levels and alternate levels within a period, much the same as timed format events.

Document information

Standard from NEK
Published: 7 November 2007
Edition: 1.0
Version: 1
Document type: NAT
ISBN:

ICS 25.040.01
National Committee TC 91

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Adopted from: IEC 61115:1992 ED1
Adopted from: IEC 62527:2007

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Abstract

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Abstract

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