Standard

NEK IEC 62433-6:2020

Sept 2020 Published

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Language English

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Abstract

IEC 62433-6:2020 describes the extraction flow for deriving an immunity macro-model of an Integrated Circuit (IC) against conducted Electrostatic Discharge (ESD) according to IEC 61000-4-2 and Electrical Fast Transients (EFT) according to IEC 61000-4-4. The model addresses physical damages due to overvoltage, thermal damage and other failure modes. Functional failures can also be addressed. This model allows the immunity simulation of the IC in an application. This model is commonly called "Integrated Circuit Immunity Model Conducted Pulse Immunity", ICIM-CPI. This document provides: - the description of ICIM-CPI macro-model elements representing electrical, thermal or logical behaviour of the IC. - a universal data exchange format based on XML.

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Standard from NEK
Published: 22 September 2020
Edition: 1.0
Version: 1
Document type: NAT
ISBN:

ICS 31.200
National Committee NEK/NK47

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Adopted from: IEC 62433-6:2020

NEK IEC 62433-6:2020

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Abstract

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Abstract

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