Standard

NEK IEC 62416:2010

Apr 2010 Published

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Language English

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Abstract

IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.

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Standard from NEK
Published: 26 April 2010
Edition: 1.0
Version: 1
Document type: NAT
ISBN:

ICS 31.080.30
National Committee NEK/NK47

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Adopted from: IEC 61061-1:1998 ED2
Adopted from: IEC 62416:2010

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Abstract

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Abstract

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