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Redline

NEK IEC 61788-7:2020 RLV

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Note: This standard has a new edition: NEK IEC 61788-7:2020

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Abstract

IEC 61788-7:2020 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy way to compare all the changes between the official IEC Standard and its previous edition. IEC 61788-7:2020 describes measurement of the surface resistance (Rs) of superconductors at microwave frequencies by the standard two-resonator method. The object of measurement is the temperature dependence of Rs at the resonant frequency. The applicable measurement range of Rs for this method is as follows: - Frequency: 8 GHz - Measurement resolution: 0,01 m Ω at 10 GHz The Rs data at the measured frequency, and that scaled to 10 GHz, assuming the f 2 rule for comparison, is reported. This third edition cancels and replaces the second edition, published in 2006. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) informative Annex B, relative combined standard uncertainty for surface resistance measurement has been added; b) precision and accuracy statements have been converted to uncertainty; c) reproducibility in surface resistant measurement has been added.

Document information

  • Redline from NEK
  • Published:
  • Edition: 3.0
  • Version: 1
  • Document type: NAT
  • ICS 17.220.20
  • ICS 29.050
  • National Committee NEK/NK90

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