Standard

NEK IEC 61580-2:1996

Jun 1996 Published

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Language English

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Abstract

Describes the test procedure intended to characterise the level of unwanted signals caused by the presence of two or more transmitting signals in waveguides or waveguide assemblies.

Document information

Standard from NEK
Published: 11 June 1996
Edition: 1.0
Version: 1
Document type: NAT
ISBN:

ICS 17.220.01
ICS 33.120.10
National Committee NEK/NK46

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Adopted from: IEC 61580-2:1996 , 0

NEK IEC 61580-2:1996

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Abstract

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Abstract

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