Standard

NEK IEC 61445:2012

Jun 2012 Published

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Language English

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Abstract

IEC 61445:2012(E) defines the information content and the data formats for the interchange of digital test program data between DATPGs and automatic test equipment (ATE) for board-level printed circuit assemblies. This information can be broadly grouped into data that defines the following: a) UUT Model; b) Stimulus and Response; c) Fault Dictionary; d) Probe.

Document information

Standard from NEK
Published: 21 June 2012
Edition: 1.0
Version: 1
Document type: NAT
ISBN:

ICS 25.040.01
ICS 35.060
National Committee TC 91

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Adopted from: IEC 61445:2012

NEK IEC 61445:2012

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Abstract

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Abstract

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