Standard

NEK IEC 61280-2-2:2012

Oct 2012 Published

Note: This standard has a new edition: NEK IEC 61280-2-2:2012

Corrigendums and amendments are bought separately.

Language English

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Abstract

IEC 61280-2-2:2012 describes a test procedure to verify compliance with a predetermined waveform mask and to measure the eye pattern and waveform parameters such as rise time, fall time, modulation amplitude and extinction ratio. This fourth edition cancels and replaces the third edition published in 2008 and constitutes a technical revision .This edition includes the following significant technical changes with respect to the previous edition: additional definitions; clarification of test procedures. Keywords: optical eye pattern, waveform, modulation amplitude, extinction ratio The contents of the corrigendum of February 2015 have been included in this copy.

Document information

Standard from NEK
Published: 25 October 2012
Edition: 4.0
Version: 1
Document type: NAT
Pages
ISBN:

ICS 33.180.01
National Committee NEK/NK86

Product Relations

Replaces: NEK IEC 61280-2-2:2008
Adopted from: IEC 61280-2-2:2012

NEK IEC 61280-2-2:2012

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