It is currently not possible to order printed and bound versions of standards. This is due to challenges related to our printing supplier. We are working to resolve the situation and apologize for any inconvenience this may cause. For other options, contact salg@standard.no.
Standard

NEK IEC 61189-3-719:2016

Published
Preview

Corrigenda and amendments are bought separately.

Language
Services

Abstract

IEC 61189-3-719:2016 specifies a test method to monitor the resistance of single plated-through holes (PTHs) in printed circuit boards (PCBs) to determine the PTH durability under thermo-mechanical stress induced by temperature cycling.

Document information

  • Standard from NEK
  • Published:
  • Edition: 1.0
  • Version: 1
  • Document type: NAT
  • ICS 31.180
  • National Committee NEK/NK91

Product Relations

  • Adopted from: IEC 61189-3-719:2016