Standard

NEK IEC 60748-11:1990

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Abstract

Applies to encapsulated semiconductor integrated circuits, including multichip integrated circuits, but excluding hybrid circuits. Gives details of the Quality Assessment Procedures, the inspection requirements, screening sequences, sampling requirements, test and measurement procedures required for the assessment of semiconductor integrated circuits, including digital, analogue and interface circuits.

Document information

  • Standard from NEK
  • Published:
  • Edition: 1.0
  • Version: 1
  • Document type: NAT
  • Pages
  • ICS 31.200
  • National Committee TC 47/SC 47A