Standard

NEK IEC 60747-18-1:2019

May 2019 Published

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Language English

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Abstract

IEC 60747-18-1:2019 (E) specifies the test methods and data analysis for the calibration of lens-free CMOS photonic array sensors. This document includes the test conditions of each process, configuration of lens-free CMOS photonic array sensors, statistical analysis of test data, calibration for planarization and linearity, and test reports.

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Standard from NEK
Published: 20 May 2019
Edition: 1.0
Version: 1
Document type: NAT
ISBN:

ICS 31.080.99
National Committee NEK/NK47

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Adopted from: IEC 60747-18-1:2019

NEK IEC 60747-18-1:2019

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Abstract

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Abstract

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