Standard

NEK IEC 60747-12:1991

Withdrawn

Corrigendums and amendments are bought separately.

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Abstract

Gives details of the quality assessment procedures, the inspection requirements, screening sequences, sampling requirements, test and measurement procedures required for semiconductor optoelectronic devices. Applies to: -Semiconductor photo-emitters; opto-electronic displays; light-emitting diodes (LED); laser diodes. -Semiconductor photosensitive devices; photodiodes; phototransistors; photothyristors. -Semiconductor imaging devices. -Photocouplers, optocouplers.

Document information

  • Standard from NEK
  • Published:
  • Withdrawn:
  • Edition: 1.0
  • Version: 1
  • Document type: NAT
  • Pages
  • ICS 31.260
  • National Committee TC 47

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