Standard

NEK IEC 60747-11:1985

Jan 1985 Withdrawn

Preview

Corrigendums and amendments are bought separately.

Language English

Services Read Online (No printing ) kr 1 860,00 Printed and bound Delivery time: 5-10 days kr 2 325,00

There are no extended editions available for this standard

Open product
Amendment 2 - Semiconductor devices. Discrete devices. Part 11: Sectional specification for discrete devices Withdrawn NEK IEC 60747-11:1985/AMD2:1996 Amendment from Publication date: May 1996 Version: 1 Pages: 20 Language: English Services: Read Online (No printing ), Printed and bound
Open product
Amendment 1 - Semiconductor devices. Discrete devices. Part 11: Sectional specification for discrete devices Withdrawn NEK IEC 60747-11:1985/AMD1:1991 Amendment from Publication date: Nov 1991 Version: 1 Pages: 12 Language: English Services: Read Online (No printing ), Printed and bound

Abstract

Applies to discrete semiconductor devices, excluding optoelectronic devices. Should be read together with the generic specification to which it refers: it gives details of the Quality Assessment Procedures, the inspection requirements, screening sequences, sampling requirements, test and measurement procedures required for the assessment of semiconductor devices.

Document information

Standard from NEK
Published: 1 January 1985
Withdrawn: 4 January 2016
Edition: 1.0
Version: 1
Document type: NAT
Pages
ISBN:

ICS 31.080.01
National Committee TC 47/SC 47E

Product Relations

Adopted from: IEC 61788-8:2010 ED2

NEK IEC 60747-11:1985

Access to standards for the entire organization

Benefits of our business solution:

Contact us today for a non-binding offer