Standard

NEK IEC 60147-0:1966

Withdrawn

Corrigendums and amendments are bought separately.

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Abstract

Deals with essential ratings and characteristics of semiconductor devices and general principles of measuring methods. This publication is intended to be used in conjunction with IEC 147-1 and 147-2.

Document information

  • Standard from NEK
  • Published:
  • Withdrawn:
  • Edition: 1.0
  • Version: 1
  • Document type: NAT
  • Pages
  • ICS 31.080.10
  • National Committee TC 47

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