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Standard

NEK EN IEC 63616:2026

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Abstract

IEC 63616:2025 relates to a conductivity measurement method of thin metal films at microwave and millimeter-wave frequencies. This method has been developed to evaluate the conductivity of a metal foil used for adhering to a substrate or the interfacial conductivity of a metal layer formed on a dielectric substrate. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband conductivity measurements by using a single resonator.

Document information

  • Standard from NEK
  • Published:
  • Edition: 2026-01
  • Version: 1
  • Document type: NAT
  • ICS 17.220.20
  • ICS 29.050
  • National Committee NEK/NK46C

Product Relations

  • Adopted from: EN IEC 63616:2026