Standard

NEK EN IEC 62878-2-603:2025

May 2025 Published

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Abstract

IEC 62878-2-603:2025 specifies the electrical test method to detect electrical connectivity defects of the stacked electronic module caused by the stacking assembly process to stack some stackable electronic modules. This method is realized to make use of bidirectional serial communication bus interface applied to the stackable electronic modules which are assured as "known good module" (KGM).

Document information

Standard from NEK
Published: 20 May 2025
Edition: 2025-04
Version: 1
Document type: NAT
ISBN:

ICS 31.180
ICS 31.190
National Committee NEK/NK91

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Adopted from: EN IEC 62878-2-603:2025

NEK EN IEC 62878-2-603:2025

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Abstract

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Abstract

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