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Standard

NEK EN 62373:2006

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Abstract

Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET)

Document information

  • Standard from NEK
  • Published:
  • Edition: 1
  • Version: 1
  • Document type: NAT
  • ICS 31.080
  • National Committee NEK/NK47

Product Relations

  • Adopted from: EN 62373:2006 , 0