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Standard

NEK EN 61967-5:2003

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Abstract

Describes a method to measure the conducted electromagnetic emission of integrated circuits either applied on a standardised test-board or on a final printed circuit board (PCB). Has a high repeatability and a good relationship to the measured RF emission of final applications with the integrated circuits used.

Document information

  • Standard from NEK
  • Published:
  • Edition: 2003-04
  • Version: 1
  • Document type: NAT
  • ICS 31.200
  • National Committee NEK/NK47

Legal references

EU law: 2004/108/EC, 2014/30/EU

Product Relations

  • Adopted from: EN 61967-5:2003 , 0