Standard

NEK EN 60749-23:2004

Aug 2026 Published

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Abstract

This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring.

Document information

Standard from NEK
Published: 26 August 2026
Edition: 2004-04
Version: 1
Document type: NAT
ISBN:

National Committee NEK/NK47

Product Relations

Replaced by: NEK EN IEC 60749-23:2026
Referred by: NEK EN IEC 60749-41:2020
Referred by: NEK EN 60749-34:2010
Referred by: NEK EN 62047-4:2010
Referred by: NEK EN 60749-34:2004
Refers: NEK EN 60747-15:2004
Adopted from: EN 60749-23:2004

NEK EN 60749-23:2004

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