Standard

JEDEC JESD89-3B

Published

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Abstract

This test method is offered as a standardized procedure to determine the terrestrial cosmic ray (i.e., high energy and thermal neutron) Soft Error Rate (SER) sensitivity of solid state volatile memory arrays and bistable logic elements (e.g., flip-flops) by measuring the error rate while the device is irradiated in a neutron or proton beam of known flux.  JESD89 describes considerations for executing such an estimate from data collected with this method. Refer to JESD89 for other background on the motivation for requirements in this test method and guidance for those elements left to the discretion of the tester. The results of this accelerated test can be used to estimate the terrestrial cosmic ray induced SER for a given terrestrial cosmic ray radiation environment.  NOTE 1 This test cannot be used to project alpha-particle-induced SER.  NOTE 2 Special considerations apply to devices that are more than memory arrays and/or bistable logic elements. These can preclude the application of this test procedure. Refer to JESD89 for further discussion on some examples.

Document information

  • Standard from JEDEC_AC
  • Published:
  • Version: 0
  • Document type: IS
  • Additional information
    • Addendum No. 3 to JESD89