Standard

JEDEC JESD22-A110E.01

Published

Singles purchase not accessible

This standard can not be purchased as a single sales.

Abstract

The Highly Accelerated Temperature and Humidity Stress Test is performed for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. It employs severe conditions of temperature, humidity, and bias which accelerate the penetration of moisture through the external protective material (encapsulant or seal) or along the interface between the external protective material and the metallic conductors which pass through it. The stress usually activates the same failure mechanisms as the “85/85” Steady-State Humidity Life Test (JEDEC Standard No. 22-A101).

Document information

  • Standard from JEDEC_AC
  • Published:
  • Version: 0
  • Document type: IS
  • Additional information
    • Minor Editorial Revision of JESD22-A110E, July 2015